j***@gmail.com
2013-04-04 09:54:35 UTC
Hello,All
TEST bit in Mode page 1ch:
1 A TEST bit set to one shall create a test device failure at the next interval time, as specified by the INTERVAL TIMER field, if the DEXCPT bit is set to zero. When the TEST bit is set to one, the MRIE and REPORT COUNT fields shall apply as if the TEST bit were zero
Do not know what "test device failure" actually mean?
Does it mean it could stimulate a fake smart failure?
TEST bit in Mode page 1ch:
1 A TEST bit set to one shall create a test device failure at the next interval time, as specified by the INTERVAL TIMER field, if the DEXCPT bit is set to zero. When the TEST bit is set to one, the MRIE and REPORT COUNT fields shall apply as if the TEST bit were zero
Do not know what "test device failure" actually mean?
Does it mean it could stimulate a fake smart failure?